Publication detail

Šum mikroplazmy v PN přechodu a její vliv na tvar VA charakteristiky

Raška Michal, Koktavý Pavel

Original Title

Šum mikroplazmy v PN přechodu a její vliv na tvar VA charakteristiky

English Title

Microplasma noise in PN junction and its influence on course of a VA characteristic

Type

conference paper

Language

Czech

Original Abstract

The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions. The existence of such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns are represented by two level current impuls noise and affect course of VA characteristics. VA characteristics can exhibit regions with negative differential resistance in certain conditions.

Key words in English

Microplasma, noise, PN junction, VA characteristic, breakdown, avalanche

Authors

Raška Michal, Koktavý Pavel

RIV year

2006

Released

30. 10. 2006

Publisher

Západočeská universita v Plzni

ISBN

80-7043-473-2

Book

elektrotechnika a informatika 2006

Edition number

1

Pages from

85

Pages to

88

Pages count

4

BibTex

@inproceedings{BUT20224,
  author="Michal {Raška} and Pavel {Koktavý}",
  title="Šum mikroplazmy v PN přechodu a její vliv na tvar VA charakteristiky",
  booktitle="elektrotechnika a informatika 2006",
  year="2006",
  volume="7",
  number="1",
  pages="4",
  publisher="Západočeská universita v Plzni",
  isbn="80-7043-473-2"
}