Publication detail

ADC LINEARITY TESTING USING LOW LINEARITY SIGNALS

SAJDL, O.

Original Title

ADC LINEARITY TESTING USING LOW LINEARITY SIGNALS

English Title

ADC LINEARITY TESTING USING LOW LINEARITY SIGNALS

Type

conference paper

Language

en

Original Abstract

This paper introduces the stimulus error identification and removal method for accurately testing ADC linearity using signal generators that may be significantly less linear than the device under test. Under this approach, two imprecise nonlinear but functionally related excitations are applied to the ADC input to obtain two sets of ADC output data. The algorithm then uses the redundant information from the two sets of data to accurately identify the nonlinearity errors in the stimuli. The algorithm then removes the stimulus error from the ADC output data, allowing the ADC nonlinearity to be accurately measured.

English abstract

This paper introduces the stimulus error identification and removal method for accurately testing ADC linearity using signal generators that may be significantly less linear than the device under test. Under this approach, two imprecise nonlinear but functionally related excitations are applied to the ADC input to obtain two sets of ADC output data. The algorithm then uses the redundant information from the two sets of data to accurately identify the nonlinearity errors in the stimuli. The algorithm then removes the stimulus error from the ADC output data, allowing the ADC nonlinearity to be accurately measured.

Keywords

ADC, testing, low linearity

RIV year

2006

Released

13.03.2006

Publisher

IEEE

Location

Marrakech, Marocco

ISBN

2-908849-17-8

Book

ISCCSP 2006

Pages from

90

Pages to

183

Pages count

94

BibTex


@inproceedings{BUT18709,
  author="Ondřej {Sajdl}",
  title="ADC LINEARITY TESTING USING LOW LINEARITY SIGNALS",
  annote="This paper introduces the stimulus error identification and removal method for accurately testing ADC linearity using signal generators that may be significantly less linear than the device under test. Under this approach, two imprecise nonlinear but functionally related excitations are applied to the ADC input to obtain two sets of ADC output data. The algorithm then uses the redundant information from the two sets of data to accurately identify the nonlinearity errors in the stimuli. The algorithm then removes the stimulus error from the ADC output data, allowing the ADC nonlinearity to be accurately measured.",
  address="IEEE",
  booktitle="ISCCSP 2006",
  chapter="18709",
  institution="IEEE",
  year="2006",
  month="march",
  pages="90",
  publisher="IEEE",
  type="conference paper"
}