Publication detail

Investigating the thickness-effect of free-standing high aspect-ratio TiO2 nanotube layers on microwave-photoresponse using planar microwave resonators

ALIJANI, M. WILTSHIRE, B. SOPHA, H. SARPANAH, Z. MISTRÍK, J. HROMÁDKO, L. ZARIFI, M. MACÁK, J.

Original Title

Investigating the thickness-effect of free-standing high aspect-ratio TiO2 nanotube layers on microwave-photoresponse using planar microwave resonators

Type

journal article in Web of Science

Language

English

Original Abstract

One-dimensional TiO2 nanotube (TNT) layers are a promising candidate for UV detection due to their distinctive anisotropic geometry which is effective for light harvesting and rapid carrier transport. Here, the photosensitivity efficiency of TNT layers with various thicknesses of 15, 50, 80, and 110 mu m was utilized at a microwave frequency regime by modeling and experimentally. A planar microwave split ring resonator (PMSRR) was designed and fabricated to operate at -8 GHz to study TNT layers by monitoring the scattering parameter (S21) of the PMSRR under a constant UV irradiation power of -96.4 mu W/cm2. According to the results, the 80 mu m thick TNT layers demonstrated the highest resonant amplitude variation for the customized PMSRR. The change of the resonant amplitude was mainly attributed to the conductivity variation contributed by perturbation of trapped electron concentration, as the dominant factor under UV illumination, and their electromagnetic wave interaction. The main advantage of the proposed method of PMSRR for microwave photosensitivity monitoring over the conventional direct current (DC) conductivity measurements is to eliminate the effect of contact resistance between the TNT layers and metal electrodes utilizing the contactless aspect of wave interactions with the TNT layers at microwave regime to perform electrode-less measurements.

Keywords

Planar microwave resonator; TiO2; Nanotube; Real-time microwave sensing; UV detection

Authors

ALIJANI, M.; WILTSHIRE, B.; SOPHA, H.; SARPANAH, Z.; MISTRÍK, J.; HROMÁDKO, L.; ZARIFI, M.; MACÁK, J.

Released

1. 6. 2023

Publisher

Elsevier

Location

AMSTERDAM

ISBN

2352-9407

Periodical

Applied Materials Today

Year of study

32

Number

1

State

Kingdom of the Netherlands

Pages from

1

Pages to

10

Pages count

10

URL

https://www.sciencedirect.com/science/article/pii/S2352940723001026

Full text in the Digital Library

http://hdl.handle.net/11012/213686

BibTex

@article{BUT183947,
  author="Mahnaz {Alijani} and Benjamin D. {Wiltshire} and Hanna Ingrid {Sopha} and Zahra {Sarpanah} and Jan {Mistrík} and Luděk {Hromádko} and Mohammad H. {Zarifi} and Jan {Macák}",
  title="Investigating the thickness-effect of free-standing high aspect-ratio TiO2 nanotube layers on microwave-photoresponse using planar microwave resonators",
  journal="Applied Materials Today",
  year="2023",
  volume="32",
  number="1",
  pages="10",
  doi="10.1016/j.apmt.2023.101832",
  issn="2352-9407",
  url="https://www.sciencedirect.com/science/article/pii/S2352940723001026"
}