Publication detail

Aging studies of atomic layer epitaxy ZnS:Mn alternating-current thin-film electroluminescent devices

AHMED, M.

Original Title

Aging studies of atomic layer epitaxy ZnS:Mn alternating-current thin-film electroluminescent devices

English Title

Aging studies of atomic layer epitaxy ZnS:Mn alternating-current thin-film electroluminescent devices

Type

conference paper

Language

en

Original Abstract

A study of the aging behavior of atomic layer epitaxy (ALE) ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is undertaken by monitoring the internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) characteristics as a function of aging time. The electrical properties are asymmetrical with respect to the applied voltage pulse polarity; the aging characteristics of such devices are also asymmetric.

English abstract

A study of the aging behavior of atomic layer epitaxy (ALE) ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is undertaken by monitoring the internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) characteristics as a function of aging time. The electrical properties are asymmetrical with respect to the applied voltage pulse polarity; the aging characteristics of such devices are also asymmetric.

Keywords

atomic layer epitaxy (ALE) ZnS:Mn, ACTFEL device,aging process, internal charge-phosphor field characteristics, capacitance-voltage characteristics

RIV year

2005

Released

27.04.2005

Publisher

FEKT VUT

Location

Brno

ISBN

80-214-2889-9

Book

Proceedings of the 11th Conference STUDENT EEICT 2005

Edition

vol.2

Pages from

188

Pages to

192

Pages count

5

BibTex


@inproceedings{BUT17777,
  author="Mustafa M. Abdalla {Ahmed}",
  title="Aging studies of atomic layer epitaxy ZnS:Mn alternating-current thin-film electroluminescent devices",
  annote="A study of the aging behavior of atomic layer epitaxy (ALE) ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is undertaken by  monitoring the internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) characteristics as a function of aging time. The electrical properties are asymmetrical with respect to the applied voltage pulse polarity; the aging characteristics of such devices are also asymmetric.",
  address="FEKT VUT",
  booktitle="Proceedings of the 11th Conference STUDENT EEICT 2005",
  chapter="17777",
  edition="vol.2",
  institution="FEKT VUT",
  year="2005",
  month="april",
  pages="188--192",
  publisher="FEKT VUT",
  type="conference paper"
}