Publication detail

Aging study of evaporated ZnS:Mn Alternating-Current Thin-Film Electroluminescent devices

AHMED, M.

Original Title

Aging study of evaporated ZnS:Mn Alternating-Current Thin-Film Electroluminescent devices

English Title

Aging study of evaporated ZnS:Mn Alternating-Current Thin-Film Electroluminescent devices

Type

conference paper

Language

en

Original Abstract

Study of the aging characteristics of evaporated ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is undertaken by monitoring the capacitance-voltage characteristics at various temperatures as a function of aging time. Short-term ACTFEL aging is characterized by a rigid shift in the C-V curve to higher turn-on voltage with aging time. Additionally, the insulator and phosphor capacitances are found to be independent of aging time, the internal phosphor threshold voltage increases slightly with aging time.

English abstract

Study of the aging characteristics of evaporated ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is undertaken by monitoring the capacitance-voltage characteristics at various temperatures as a function of aging time. Short-term ACTFEL aging is characterized by a rigid shift in the C-V curve to higher turn-on voltage with aging time. Additionally, the insulator and phosphor capacitances are found to be independent of aging time, the internal phosphor threshold voltage increases slightly with aging time.

Keywords

evaporated ZnS:Mn, electroluminescent device, aging process

RIV year

2005

Released

27.04.2005

Publisher

Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno

Location

Brno

ISBN

80-214-2889-9

Book

Proceedings of the 11th confernece STUDENT EEICT 2005

Edition

vol.2

Pages from

193

Pages to

197

Pages count

5

BibTex


@inproceedings{BUT17776,
  author="Mustafa M. Abdalla {Ahmed}",
  title="Aging study of evaporated ZnS:Mn Alternating-Current Thin-Film Electroluminescent devices",
  annote="Study of the aging characteristics of evaporated  ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is undertaken by monitoring the capacitance-voltage  characteristics at various temperatures as a function of aging time.  Short-term ACTFEL aging is characterized by a rigid shift in the C-V curve to higher turn-on voltage with aging time. Additionally, the insulator and phosphor capacitances are found to be independent of aging time, the internal phosphor threshold voltage increases slightly with aging time.",
  address="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  booktitle="Proceedings of the 11th confernece STUDENT EEICT 2005",
  chapter="17776",
  edition="vol.2",
  institution="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  year="2005",
  month="april",
  pages="193--197",
  publisher="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  type="conference paper"
}