Publication detail

Automatically-Designed Fault-Tolerant Systems: Failed Partitions Recovery

LOJDA, J. PÁNEK, R. KOTÁSEK, Z.

Original Title

Automatically-Designed Fault-Tolerant Systems: Failed Partitions Recovery

Type

conference paper

Language

English

Original Abstract

This paper presents and describes our design automation toolkit for automatic synthesis of fault tolerant systems from unhardened systems. The toolkit is composed of various parts and tools and its aim is to design its internal algorithms in such way to be reusable among different HW description languages. In this paper, VHDL description is used to present the possibilities of the toolkit. The experimental part of the paper presents automatic synthesis of a benchmark system into a limited chip area. The optimization goal was to maximize the median time to failure (a.k.a. t50) parameter. The main part of the experimental activities comprises incorporation of a partial dynamic reconfiguration controller into the system design to recover the selected component of the system. Two systems utilizing recovery with the usage of the FPGA dynamic reconfiguration technique show promising results in terms of reliability. The recovered system, in which the controller is apart of the FPGA (e.g. in a different radiation-hardened chip), achieves by 70% better t50 parameter, compared to the system without recovery.

Keywords

Fault-Tolerant System Design, Electronic Design Automation, Redundancy Insertion, Redundancy Allocation, Multiple-choice Knapsack Problem, FPGA, VHDL, t50

Authors

LOJDA, J.; PÁNEK, R.; KOTÁSEK, Z.

Released

10. 9. 2021

Publisher

Institute of Electrical and Electronics Engineers

Location

Batumi

ISBN

978-1-6654-4503-0

Book

2021 IEEE East-West Design and Test Symposium, EWDTS 2021 - Proceedings

Pages from

26

Pages to

33

Pages count

8

URL

https://www.fit.vut.cz/research/publication/12529/

BibTex

@inproceedings{BUT175799,
  author="Jakub {Lojda} and Richard {Pánek} and Zdeněk {Kotásek}",
  title="Automatically-Designed Fault-Tolerant Systems: Failed Partitions Recovery",
  booktitle="2021 IEEE East-West Design and Test Symposium, EWDTS 2021 - Proceedings",
  year="2021",
  pages="26--33",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Batumi",
  doi="10.1109/EWDTS52692.2021.9580996",
  isbn="978-1-6654-4503-0",
  url="https://www.fit.vut.cz/research/publication/12529/"
}