Publication detail

Aberration correction for low voltage optimized transmission electron microscopy

BAČOVSKÝ, J.

Original Title

Aberration correction for low voltage optimized transmission electron microscopy

Type

journal article in Web of Science

Language

English

Original Abstract

Further development of low voltage electron microscopy leads to an aberration correction of the device in order to improve its spatial resolution. The integration of a corrector to a desktop transmission electron microscope with exclusively low-voltage design seems to be a challenging task. The benefits and potential of the Rose hexapole corrector implemented to such a system are critically considered in this paper. The feasibility of miniaturized corrector suitable for desktop LVEM is especially discussed, including the aspect of corrector contribution to chromatic aberration that appears to be crucial. Optimal corrector parameters and resolution limits of such a system are proposed. Improved spatial resolution Spherical aberration correction Permanent magnet transfer lenses (C) 2018 DELONG INSTRUMENTS a.s. Published by Elsevier B.V.

Keywords

Low voltage transmission electron microscopy; Aberration correction; Hexapole corrector

Authors

BAČOVSKÝ, J.

Released

25. 8. 2018

Publisher

Elsevier

Location

AMSTERDAM

ISBN

2215-0161

Periodical

MethodsX

Year of study

5

Number

1

State

Kingdom of the Netherlands

Pages from

1033

Pages to

1047

Pages count

15

URL

https://www.sciencedirect.com/science/article/pii/S2215016118301377

Full text in the Digital Library

http://hdl.handle.net/11012/196362

BibTex

@article{BUT169885,
  author="Jaromír {Bačovský}",
  title="Aberration correction for low voltage optimized transmission electron microscopy",
  journal="MethodsX",
  year="2018",
  volume="5",
  number="1",
  pages="1033--1047",
  doi="10.1016/j.mex.2018.08.009",
  issn="2215-0161",
  url="https://www.sciencedirect.com/science/article/pii/S2215016118301377"
}