Publication detail

Transient Simulation of Scanning Electrochemical Microscope

MAČÁK, M. VYROUBAL, P.

Original Title

Transient Simulation of Scanning Electrochemical Microscope

Type

conference paper

Language

English

Original Abstract

The presented article describes a transient numerical model of a scanning electrochemical microscope used for investigating topography and conductivity of various surfaces. The custom numerical model, implemented into Ansys Fluent software, is based on Poisson-Nernst-Planck equations coupled with electrochemical reactions. Presented simulations investigate the influence of irregularities on the scanned surface. Simulations were carried out for different cases with arrangement of conducting and insulating surfaces.

Keywords

Electrochemistry, CFD, Ansys Fluent, microscope

Authors

MAČÁK, M.; VYROUBAL, P.

Released

14. 12. 2020

Publisher

ECS Transactions

ISBN

978-1-60768-909-6

Book

21st International Conference on Advanced Batteries, Accumulators and Fuel Cells (ABAF 2020)

Edition

99

Edition number

1

Pages from

457

Pages to

464

Pages count

8

URL

https://iopscience.iop.org/article/10.1149/09901.0457ecst

BibTex

@inproceedings{BUT167545,
  author="Martin {Mačák} and Petr {Vyroubal}",
  title="Transient Simulation of Scanning Electrochemical Microscope",
  booktitle="21st International Conference on Advanced Batteries, Accumulators and Fuel Cells (ABAF 2020)",
  year="2020",
  series="99",
  number="1",
  pages="457--464",
  publisher="ECS Transactions",
  doi="10.1149/09901.0457ecst",
  isbn="978-1-60768-909-6",
  url="https://iopscience.iop.org/article/10.1149/09901.0457ecst"
}