Publication detail

Co effect on the structural, chemical and frequency depended electrical properties of YbFeO3 perovskite oxide compound

Coşkun, M. Polat, O. Coşkun, F.M. Durmus, Z. Caglar, M. Turut, A.

Original Title

Co effect on the structural, chemical and frequency depended electrical properties of YbFeO3 perovskite oxide compound

Type

journal article in Web of Science

Language

English

Original Abstract

We have synthesized YbFe1− xCoxO3 (x = 0, 0.01, 0.05, 0.10) compounds by the conventional solid-state method. Structural and chemical analysis of the synthesized compounds have been carried out by XPS, SEM and EDX techniques. Frequency dependent (1–107 Hz) electrical properties including the loss tangent, real and imaginary part of impedance and resistivity have been examined in wide range temperature (from − 100 to 100 °C with 20 °C step) using Dielectric/Impedance Spectrometer (Novocontrol). The frequency dependent loss tangent plots have showed different dielectric relaxations peaks and the activation energies of the compounds have been calculated from those peaks using Arrhenius relation. The resistivity measurement results revealed that the increasing Co doping ratio decreases the resistivity of the compounds.

Keywords

Activation energy; Arrhenius plots; Chemical analysis; Iron compounds; Perovskite; Ytterbium compounds

Authors

Coşkun, M.; Polat, O.; Coşkun, F.M.; Durmus, Z.; Caglar, M.; Turut, A.

Released

30. 7. 2019

ISBN

0957-4522

Periodical

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

Year of study

30

Number

14

State

Kingdom of the Netherlands

Pages from

13336

Pages to

13346

Pages count

11

URL

https://link.springer.com/article/10.1007/s10854-019-01701-6

BibTex

@article{BUT162043,
  author="Coşkun, M. and Polat, O. and Coşkun, F.M. and Durmus, Z. and Caglar, M. and Turut, A.",
  title="Co effect on the structural, chemical and frequency depended electrical properties of YbFeO3 perovskite oxide compound",
  journal="JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS",
  year="2019",
  volume="30",
  number="14",
  pages="13336--13346",
  doi="10.1007/s10854-019-01701-6",
  issn="0957-4522",
  url="https://link.springer.com/article/10.1007/s10854-019-01701-6"
}