Publication detail

Fast process detection of the chemical elements

NOVÁK, L. ŠTEFFAN, P.

Original Title

Fast process detection of the chemical elements

English Title

Fast process detection of the chemical elements

Type

journal article - other

Language

en

Original Abstract

This paper describes a Fast mapping of the material composition via Sci-Trace devices. The measurement method is used LIBS (Laser Induced Breakdown Spectroscopy) for detection of the chemical elements. The method of fast mapping is implemented in the program LabView. In the paper is only mentioned the diagram of the process measurement implemented in LabView. The same program controls the whole electronic part of the devices. This paper compares two methods for data collection. Both methods are compared and described their advantages and disadvantages.

English abstract

This paper describes a Fast mapping of the material composition via Sci-Trace devices. The measurement method is used LIBS (Laser Induced Breakdown Spectroscopy) for detection of the chemical elements. The method of fast mapping is implemented in the program LabView. In the paper is only mentioned the diagram of the process measurement implemented in LabView. The same program controls the whole electronic part of the devices. This paper compares two methods for data collection. Both methods are compared and described their advantages and disadvantages.

Keywords

LIBS, Fast process mapping, Layout detection, Chemical elements, LabView

Released

21.10.2019

Publisher

Electroscope

Location

Univezitní 8 Plzeň

Pages from

1

Pages to

3

Pages count

3

URL

BibTex


@article{BUT159529,
  author="Lukáš {Novák} and Pavel {Šteffan}",
  title="Fast process detection of the chemical elements",
  annote="This paper describes a Fast mapping of the material composition via Sci-Trace devices. The measurement method is used LIBS (Laser Induced Breakdown Spectroscopy) for detection of the chemical elements. The method of fast mapping is implemented in the program LabView. In the paper is only mentioned the diagram of the process measurement implemented in LabView. The same program controls the whole electronic part of the devices. This paper compares two methods for data collection. Both methods are compared and described their advantages and disadvantages.",
  address="Electroscope",
  chapter="159529",
  howpublished="online",
  institution="Electroscope",
  number="2",
  volume="2019",
  year="2019",
  month="october",
  pages="1--3",
  publisher="Electroscope",
  type="journal article - other"
}