Publication detail

Evolutionary Design of Polymorphic Gates Using Ambipolar Transistors

NEVORAL, J. RŮŽIČKA, R. MRÁZEK, V.

Original Title

Evolutionary Design of Polymorphic Gates Using Ambipolar Transistors

Type

conference paper

Language

English

Original Abstract

The objective of the paper is to introduce a new approach to the evolutionary design of polymorphic digital circuits conducted directly at transistor level. A discrete eventdriven simulator was utilized to achieve reasonable trade-off between performance and precision. The proposed approach was evaluated on a set of polymorphic logic circuits controlled by switching the power rails. It was demonstrated that the proposed method is able to produce valid solutions. A lot of polymorphic gates based on ambipolar transistors were designed, which provide transistor savings compared to existing circuits. A new class of polymorphic gates was discovered thanks to the proposed system - gates based on conventional MOS transistors whose functions are changed by switching the power rails. They seem to have the best parameters among currently known polymorphic gates based on conventional transistors.

Keywords

Polymorphic electronics, polymorphic gate, ambipolar transistor, digital circuit, logic gate, evolutionary design, CGP

Authors

NEVORAL, J.; RŮŽIČKA, R.; MRÁZEK, V.

Released

6. 12. 2016

Publisher

Institute of Electrical and Electronics Engineers

Location

Athens

ISBN

978-1-5090-4240-1

Book

2016 IEEE Symposium Series on Computational Intelligence

Pages from

1

Pages to

8

Pages count

8

URL

BibTex

@inproceedings{BUT131009,
  author="Jan {Nevoral} and Richard {Růžička} and Vojtěch {Mrázek}",
  title="Evolutionary Design of Polymorphic Gates Using Ambipolar Transistors",
  booktitle="2016 IEEE Symposium Series on Computational Intelligence",
  year="2016",
  pages="1--8",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Athens",
  doi="10.1109/SSCI.2016.7850177",
  isbn="978-1-5090-4240-1",
  url="http://ieeexplore.ieee.org/document/7850177/"
}