Publication detail

Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits

STRNADEL, J.

Original Title

Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits

English Title

Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits

Type

conference paper

Language

en

Original Abstract

The paper presents a method of modeling and analysis of fault-tolerant (FT) electronic systems by means of a novel statistical model checking (SMC) approach available in the UPPAAL SMC tool. The method can be seen as an alternative to classical analytic approaches based on instruments such as fault-tree or Markov reliability models of the above-specified systems. Main goal of the paper is to show that - taking the advantage of SMC - the reliability analysis of systems can be facilitated even for adverse conditions such as inconstant failure (hazard) rate of inner system components. In the paper, basic terms and principles related to modeling and analysis of FT systems are summarized, followed by a short introduction to the UPPAAL SMC tool, its practical applicability to analysis and modeling of basic FT systems and evaluation of the results achieved on basis of the tool.

English abstract

The paper presents a method of modeling and analysis of fault-tolerant (FT) electronic systems by means of a novel statistical model checking (SMC) approach available in the UPPAAL SMC tool. The method can be seen as an alternative to classical analytic approaches based on instruments such as fault-tree or Markov reliability models of the above-specified systems. Main goal of the paper is to show that - taking the advantage of SMC - the reliability analysis of systems can be facilitated even for adverse conditions such as inconstant failure (hazard) rate of inner system components. In the paper, basic terms and principles related to modeling and analysis of FT systems are summarized, followed by a short introduction to the UPPAAL SMC tool, its practical applicability to analysis and modeling of basic FT systems and evaluation of the results achieved on basis of the tool.

Keywords

modeling, analysis, fault tolerant, FT, statistical model checking, SMC, UPPAAL SMC, reliability analysis, probability distribution, bathtub, fault, transient, permanent, intermittent, behavior, type, description, signalization, scenario, tripple modular redundancy, TMR

Released

20.04.2016

Publisher

Slovak University of Technology in Bratislava

Location

Bratislava

ISBN

978-80-8086-256-5

Book

Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Edition

NEUVEDEN

Edition number

NEUVEDEN

Pages from

32

Pages to

37

Pages count

6

URL

Documents

BibTex


@inproceedings{BUT130933,
  author="Josef {Strnadel}",
  title="Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits",
  annote="The paper presents a method of modeling and analysis of fault-tolerant (FT)
electronic systems by means of a novel statistical model checking (SMC) approach
available in the UPPAAL SMC tool. The method can be seen as an alternative to
classical analytic approaches based on instruments such as fault-tree or Markov
reliability models of the above-specified systems. Main goal of the paper is to
show that - taking the advantage of SMC - the reliability analysis of systems can
be facilitated even for adverse conditions such as inconstant failure (hazard)
rate of inner system components. In the paper, basic terms and principles related
to modeling and analysis of FT systems are summarized, followed by a short
introduction to the UPPAAL SMC tool, its practical applicability to analysis and
modeling of basic FT systems and evaluation of the results achieved on basis of
the tool.",
  address="Slovak University of Technology in Bratislava",
  booktitle="Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)",
  chapter="130933",
  edition="NEUVEDEN",
  howpublished="electronic, physical medium",
  institution="Slovak University of Technology in Bratislava",
  year="2016",
  month="april",
  pages="32--37",
  publisher="Slovak University of Technology in Bratislava",
  type="conference paper"
}