Data acquisition system for burn-in tests of high resolution ADC modules
HOFMAN, J. HÁZE, J.
This DAQ system has been developed to allow a long term burn-in testing of ADC modules. Each of these modules consists of a high resolution A/D converter and a precise voltage reference. To reach excellent stability, these modules must be running long term, at least 1000 hours.
burn-in test, voltage reference, A/D convertor, data acquisition
168 Maxwell Avenue, Harwell, DIDCOT, Oxfordshire, OX 11 0QT, UK