Publication detail
COMPARISON OF THE METHODS USED TO LOW LEVEL DC VOLTAGE MEASUREMENT
OBŠILOVÁ, L.
Original Title
COMPARISON OF THE METHODS USED TO LOW LEVEL DC VOLTAGE MEASUREMENT
English Title
COMPARISON OF THE METHODS USED TO LOW LEVEL DC VOLTAGE MEASUREMENT
Type
conference paper
Language
en
Original Abstract
This paper deals with comparison of three methods used to measure low level DC voltage. It is about Reference Step Method, potentiometric method and direct method. Measurement was held in cooperation with the Czech metrology institute. Comparison of the methods consist of a graphic comparison and a key comparison. Results showed good agreement of all methods except for potentiometric method at one range of a device under test.
English abstract
This paper deals with comparison of three methods used to measure low level DC voltage. It is about Reference Step Method, potentiometric method and direct method. Measurement was held in cooperation with the Czech metrology institute. Comparison of the methods consist of a graphic comparison and a key comparison. Results showed good agreement of all methods except for potentiometric method at one range of a device under test.
Keywords
DC voltage; Reference Step Method; potentiometric method; uncertainty
Released
28.04.2016
Publisher
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních
Location
Brno
ISBN
978-80-214-5350-0
Book
Proceedings of the 22nd Conference STUDENT EEICT 2016
Edition
1
Edition number
první
Pages from
406
Pages to
410
Pages count
777
URL
Documents
BibTex
@inproceedings{BUT124561,
author="Lucie {Obšilová}",
title="COMPARISON OF THE METHODS USED TO LOW LEVEL DC VOLTAGE MEASUREMENT",
annote="This paper deals with comparison of three methods used to measure low level DC voltage. It is about Reference Step Method, potentiometric method and direct method. Measurement was held in cooperation with the Czech metrology institute. Comparison of the methods consist of a graphic comparison and a key comparison. Results showed good agreement of all methods except for potentiometric method at one range of a device under test.",
address="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
booktitle="Proceedings of the 22nd Conference STUDENT EEICT 2016",
chapter="124561",
edition="1",
howpublished="online",
institution="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
year="2016",
month="april",
pages="406--410",
publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
type="conference paper"
}