Publication detail

Applying Feedback Control in Atomic Force Microscopy.

HROUZEK, M.

Original Title

Applying Feedback Control in Atomic Force Microscopy.

Type

conference paper

Language

English

Original Abstract

The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the AFM control. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF.

Key words in English

Feedback Control, Atomic Force Microscopy

Authors

HROUZEK, M.

RIV year

2004

Released

29. 4. 2004

Publisher

VUT Brno

Location

Brno

Pages from

200

Pages to

204

Pages count

5

BibTex

@inproceedings{BUT10882,
  author="Michal {Hrouzek}",
  title="Applying Feedback Control in Atomic Force Microscopy.",
  booktitle="Sborník pracíkonference a souteze Student EEICT 2004",
  year="2004",
  pages="5",
  publisher="VUT Brno",
  address="Brno"
}