Publication detail

Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

STRNADEL, J., KOTÁSEK, Z.

Original Title

Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

English Title

Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

Type

conference paper

Language

en

Original Abstract

In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.

English abstract

In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.

Keywords

design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm

RIV year

2002

Released

01.09.2002

Publisher

IEEE Computer Society Press

Location

Los Alamitos

ISBN

0-7695-1790-0

Book

Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002

Pages from

166

Pages to

173

Pages count

8

URL

Documents

BibTex


@inproceedings{BUT10243,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level",
  annote="In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.",
  address="IEEE Computer Society Press",
  booktitle="Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002",
  chapter="10243",
  institution="IEEE Computer Society Press",
  year="2002",
  month="september",
  pages="166--173",
  publisher="IEEE Computer Society Press",
  type="conference paper"
}