Publication detail

Safety through Common Industrial Protocol

ŠTOHL, R. STIBOR, K.

Original Title

Safety through Common Industrial Protocol

Czech Title

Bezpečnost pomocí CIP

English Title

Safety through Common Industrial Protocol

Type

conference paper

Language

en

Original Abstract

Safety is important factor in industry. This article should show that there can be better way to take care about safety functions, than hard-wired components. It should show that use of integrated safety solutions can bring a lot of advantages to industrial applications.

Czech abstract

Bezpečnost je důležitým faktorem v průmyslu. Tento článek ukázuje, že existuje lepší cesta, jak se postarat o bezpečnostní funkce, než drátově propojené komponenty. Měl by ukázat že použití integrované bezpečnostní řešení může přinést řadu výhod pro průmyslové aplikace.

English abstract

Safety is important factor in industry. This article should show that there can be better way to take care about safety functions, than hard-wired components. It should show that use of integrated safety solutions can bring a lot of advantages to industrial applications.

Keywords

machinery; machinery safety; CIP; CIP safety; M.I.C.E;, SIL

RIV year

2013

Released

20.05.2013

Publisher

IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA

Location

Rytro, Poland

ISBN

978-1-4673-4490-6

Book

Proceedings of the 14th International Carpathian Conference (ICCC)

Edition

1

Edition number

1

Pages from

1

Pages to

4

Pages count

4

BibTex


@inproceedings{BUT101258,
  author="Radek {Štohl} and Karel {Stibor}",
  title="Safety through Common Industrial Protocol",
  annote="Safety is important factor in industry. This article
should show that there can be better way to take care about
safety functions, than hard-wired components. It should show
that use of integrated safety solutions can bring a lot of
advantages to industrial applications.",
  address="IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA",
  booktitle="Proceedings of the 14th International Carpathian Conference (ICCC)",
  chapter="101258",
  edition="1",
  howpublished="online",
  institution="IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA",
  year="2013",
  month="may",
  pages="1--4",
  publisher="IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA",
  type="conference paper"
}