Project detail

The electro-ultrasonic and narrowband resonant ultrasonic spectroscopy for testing of electronic materials and devices

Duration: 01.01.2010 — 31.12.2011

On the project

Proposed project will elaborate new measuring method based on the electro-ultrasonic spectroscopy for testing of materials and electronic devices such as thin and thick film resistors, capacitors and varistors. Aim of this work is theoretical explanation of new effects which are the results of interaction between phonon corresponding to the elastic waves and electron transport near cracks and inhomogenities in the device structure. Nonlinear electro-ultrasonic spectroscopy is sensitivite to all cracks in conductive thick film resistors and it gives information on material quality and reproducibility of technology. Resonant Ultrasonic Spectroscopy (RUS) allows differentiating the elements with different physical structure due to some discrepancies in the technological process of their production. They can be used as precursory phenomena for devices. We can use this method to compare different preparation technologies and defect creation during the operating life time. Other application field could be in the electronics e.g. cracks and inhomogenities creation in electronic devices such as thin film resistors or ceramic capacitors. Similar application is supposed in the technology where high reliability and quality are demanded. Application of detailed tests of products for possible materials degradation or for the deviation from the demanded material quality is a categorical request of present industry. Each produced item is regularly examined, which requires the application of non-destructive testing (NDT). Proposed methods will be verified by known low frequency noise spectroscopy, electrical nonlinearity testing method, and using Atomic Force Microscope (AFM).

Description in Czech
Proposed project will elaborate new measuring method based on the electro-ultrasonic spectroscopy for testing of materials and electronic devices such as thin and thick film resistors, capacitors and varistors. Aim of this work is theoretical explanation of new effects which are the results of interaction between phonon corresponding to the elastic waves and electron transport near cracks and inhomogenities in the device structure. Nonlinear electro-ultrasonic spectroscopy is sensitivite to all cracks in conductive thick film resistors and it gives information on material quality and reproducibility of technology. Resonant Ultrasonic Spectroscopy (RUS) allows differentiating the elements with different physical structure due to some discrepancies in the technological process of their production. They can be used as precursory phenomena for devices. We can use this method to compare different preparation technologies and defect creation during the operating life time. Other application field could be in the electronics e.g. cracks and inhomogenities creation in electronic devices such as thin film resistors or ceramic capacitors. Similar application is supposed in the technology where high reliability and quality are demanded. Application of detailed tests of products for possible materials degradation or for the deviation from the demanded material quality is a categorical request of present industry. Each produced item is regularly examined, which requires the application of non-destructive testing (NDT). Proposed methods will be verified by known low frequency noise spectroscopy, electrical nonlinearity testing method, and using Atomic Force Microscope (AFM).

Keywords
NDT, Elektro-ultrazvuková spektroskopie, resonanční ultrazvuková spektroskopie, elektronické materiály, elektronické součástky

Key words in Czech
NDT, Electro-ultrasonic spectroscopy, Resonant ultrasonic spectroscopy, electronic materials, electronic devices

Mark

MEB051003

Default language

English

People responsible

Sedláková Vlasta, doc. Ing., Ph.D.
- principal person responsible (2010-01-01 - not assigned)

Units

Department of Physics
- (2010-01-01 - not assigned)

Funding resources

Ministerstvo školství, mládeže a tělovýchovy ČR - KONTAKT

- whole funder (2010-01-01 - not assigned)

Results

CICHOSZ, J.; HASSE, L.; SZEWCZYK, A.; SEDLÁK, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Non-linear electro-ultrasonic spectroscopy of high-voltage varistors. In XI Krajowa Konferencja Elektroniki. Warszawa: Sigma-Not, 2012. p. 115-120. ISBN: 978-83-934712-0-1.
Detail

SEDLÁK, P.; TOFEL, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HASSE, L. Ultrasonics spectroscopy of silicon single crystal. METROL MEAS SYST, 2011, vol. 18, no. 4, p. 621-630. ISSN: 0860-8229.
Detail