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Project detail
Duration: 01.01.2002 — 31.12.2004
Funding resources
Czech Science Foundation - Standardní projekty
- whole funder (2002-01-01 - 2004-12-31)
Mark
GA102/02/0506
Default language
Czech
People responsible
Spousta Jiří, prof. RNDr., Ph.D. - principal person responsible
Units
Institute of Physical Engineering- (2002-11-28 - not assigned)
Results
URBÁNEK, M., SPOUSTA, J., NAVRÁTIL, K., FIEDOR, M., CHMELÍK, R., BUČEK, M., ŠIKOLA, T. Instrument for Thin Films Diagnostics by UV Spectroscopic Reflectometry. In ECASIA '03 Book of abstracts. Berlin: ECASIA, 2003. p. 284 ( p.)Detail
ČECHAL, J., TICHOPÁDEK, P., NEBOJSA, A., BONAVENTUROVÁ - ZRZAVECKÁ, O., URBÁNEK, M., NAVRÁTIL, K., ŠIKOLA, T. In-situ analysis of PMPSI by spectroscopic ellipsometry and XPS. In ECASIA 10 Book of Abstracts. Berlin: ECASIA, 2003. p. 226 ( p.)Detail
URBÁNEK, M.; SPOUSTA, J.; NAVRÁTIL, K.; SZOTKOWSKI, R.; CHMELÍK, R.; BUČEK, M.; ŠIKOLA, T. Instrument for thin film diagnostics by UV spectroscopic reflectometry. Surface and Interface Analysis, 2004, vol. 36, no. 8, p. 1102 ( p.)ISSN: 0142-2421.Detail
SPOUSTA, J., ŠIKOLA, T., ZLÁMAL, J., URBÁNEK, M., NAVRÁTIL, K., JIRUŠE, J., CHMELÍK, R., NEBOJSA, A. In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films. Surface and Interface Analysis, 2002, vol. 34, no. 1, p. 664 ( p.)ISSN: 0142-2421.Detail
URBÁNEK, M., SPOUSTA, J., NAVRÁTIL, K., BUČEK, M., NEUGEBAUER, P., ŠIKOLA, T. Systém pro měření homogenity optických vlastností tenkých vrstev. 2003, roč. 48, č. 6, s. 163 ( s.)ISSN: 0447-6411.Detail
VAIS, J., ŽENÍŠEK, J., JURKOVIČ, P., ČECHAL, J., DITTRICHOVÁ, L., SPOUSTA, J., BOCHNÍČEK, Z., ŠIKOLA, T. Interface and depth profile analysis of magnetic ultrathin films. In ECASIA 10 Book of Abstracts. Berlin: ECASIA, 2003. p. 226 ( p.)Detail