Detail publikace

Characterization of electrophoretic suspension for thin polymer film deposition

Originální název

Characterization of electrophoretic suspension for thin polymer film deposition

Anglický název

Characterization of electrophoretic suspension for thin polymer film deposition

Jazyk

en

Originální abstrakt

Optical absorption and fluorescence spectra of poly[2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions, show a clearly distinguished differences (e. g. peak broadening and shifting), which could be used for a characterization of suspensions with different acetonitrile content. The DLS measurement of the suspensions prepared shows a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft non-contacting optical profilometer method, based on chromatic aberration was used to measure the thickness. AFM imaging of spin coated and EPD films shows film roughness of 20-40 nm and 40-80 nm, respectively. The film roughness of the EPD film seems to be less than the suspension particle size obtained by DLS method, due probably to the partial film dissolving by the presented in the suspension toluene.

Anglický abstrakt

Optical absorption and fluorescence spectra of poly[2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions, show a clearly distinguished differences (e. g. peak broadening and shifting), which could be used for a characterization of suspensions with different acetonitrile content. The DLS measurement of the suspensions prepared shows a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft non-contacting optical profilometer method, based on chromatic aberration was used to measure the thickness. AFM imaging of spin coated and EPD films shows film roughness of 20-40 nm and 40-80 nm, respectively. The film roughness of the EPD film seems to be less than the suspension particle size obtained by DLS method, due probably to the partial film dissolving by the presented in the suspension toluene.

BibTex


@article{BUT94435,
  author="Daniela {Mladenova} and Martin {Weiter} and Imad {Ouzzane} and Martin {Vala} and Ivaylo {Zhivkov}",
  title="Characterization of electrophoretic suspension for thin polymer film deposition",
  annote="Optical absorption and fluorescence spectra of poly[2-methoxy-5-(3',7'-dimethyloctyloxy)-1,4-phenylenevinylene] toluene solutions and 50:50% toluene/acetonitrile suspensions, show a clearly distinguished differences (e. g. peak broadening and shifting), which could be used for a characterization of suspensions with different acetonitrile content. The DLS measurement of the suspensions prepared shows a particle size of 90 nm. Thin films with thicknesses of about 400 nm were prepared by electrophoretic deposition (EPD) and spin coating. As the films are very soft non-contacting optical profilometer method, based on chromatic aberration was used to measure the thickness. AFM imaging of spin coated and EPD films shows film roughness of 20-40 nm and 40-80 nm, respectively. The film roughness of the EPD film seems to be less than the suspension particle size obtained by DLS method, due probably to the partial film dissolving by the presented in the suspension toluene.",
  address="IOPscience (Institute of Physics)",
  chapter="94435",
  institution="IOPscience (Institute of Physics)",
  number="1",
  volume="356",
  year="2012",
  month="march",
  pages="1--4",
  publisher="IOPscience (Institute of Physics)",
  type="journal article - other"
}