Detail publikace

Analytic Approach to RTL Testability Analysis

KOTÁSEK, Z., STRNADEL, J.

Originální název

Analytic Approach to RTL Testability Analysis

Anglický název

Analytic Approach to RTL Testability Analysis

Jazyk

en

Originální abstrakt

The paper deals with analytical approach to the RTL testability analysis and its results. Approach is based as on circuit i path analysis, finding i paths existence conditions and the ways in which these conditions could be set, as on difficult to control/observe nodes location. On these testability analysis results basis, UUA (Unit Under Analysis) modification is suggested. This modification is based on insertion of selected registers into scan chain in order to improve controllability/observability properties of previously located difficult to control/observe nodes. The goal of presented methodology is to maximally utilise current UUA structure for future test application to reduce necessary modifications for UUA testability improvements suggested by UUA testability analysis results.

Anglický abstrakt

The paper deals with analytical approach to the RTL testability analysis and its results. Approach is based as on circuit i path analysis, finding i paths existence conditions and the ways in which these conditions could be set, as on difficult to control/observe nodes location. On these testability analysis results basis, UUA (Unit Under Analysis) modification is suggested. This modification is based on insertion of selected registers into scan chain in order to improve controllability/observability properties of previously located difficult to control/observe nodes. The goal of presented methodology is to maximally utilise current UUA structure for future test application to reduce necessary modifications for UUA testability improvements suggested by UUA testability analysis results.

Dokumenty

BibTex


@inproceedings{BUT5615,
  author="Zdeněk {Kotásek} and Josef {Strnadel}",
  title="Analytic Approach to RTL Testability Analysis",
  annote="The paper deals with analytical approach to the RTL testability analysis and its results. Approach is based as on circuit i path analysis, finding i paths existence conditions and the ways in which these conditions could be set, as on difficult to control/observe nodes location.  On these testability analysis results basis, UUA (Unit Under Analysis) modification is suggested. This modification is based on insertion of selected registers into scan chain in order to improve controllability/observability properties of previously located difficult to control/observe nodes. The goal of presented methodology is to maximally utilise current UUA structure for future test application to reduce necessary modifications for UUA testability improvements suggested by UUA testability analysis results.",
  address="Brno University of Technology",
  booktitle="Proceedings of 7th Conference Student FEI 2001",
  chapter="5615",
  institution="Brno University of Technology",
  year="2001",
  month="december",
  pages="363",
  publisher="Brno University of Technology",
  type="conference paper"
}