Detail publikace

Non Destructive Testing of Thinck Film Electroluminiscent Lamps

Originální název

Non Destructive Testing of Thinck Film Electroluminiscent Lamps

Anglický název

Non Destructive Testing of Thinck Film Electroluminiscent Lamps

Jazyk

en

Originální abstrakt

Non destructive testing of thick film electroluminiscent lamps is based on electric charge transport characteristics and electronic noise spectroscopy. We report on noise spectroscopy used to estimate the quality and reliability of thick electroluminiscent layers

Anglický abstrakt

Non destructive testing of thick film electroluminiscent lamps is based on electric charge transport characteristics and electronic noise spectroscopy. We report on noise spectroscopy used to estimate the quality and reliability of thick electroluminiscent layers

BibTex


@inproceedings{BUT5384,
  author="Lubomír {Grmela} and Pavel {Koktavý} and Karel {Liedermann} and Josef {Šikula} and Jan {Pavelka} and Pavel {Tománek}",
  title="Non Destructive Testing of Thinck Film Electroluminiscent Lamps",
  annote="Non destructive testing of thick film electroluminiscent lamps is based on electric charge transport characteristics and electronic noise spectroscopy. We report on noise spectroscopy used to estimate the quality and reliability of thick electroluminiscent layers",
  address="European Federation for Non-Destructive Testing",
  booktitle="8-th ECNDT, Barcelona",
  chapter="5384",
  institution="European Federation for Non-Destructive Testing",
  year="2002",
  month="july",
  pages="214",
  publisher="European Federation for Non-Destructive Testing",
  type="conference paper"
}