Detail publikace

Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors

Originální název

Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors

Anglický název

Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors

Jazyk

en

Originální abstrakt

The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperature dependences.

Anglický abstrakt

The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperature dependences.

BibTex


@inproceedings{BUT31369,
  author="Josef {Šikula} and Vlasta {Sedláková} and Jan {Hlávka} and Pavel {Höschel} and Zdeněk {Sita} and Tomáš {Zedníček} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors",
  annote="The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperature dependences.",
  booktitle="25th Capacitor and Resistor Technology Symposium",
  chapter="31369",
  number="10",
  year="2005",
  month="january",
  pages="210",
  type="conference paper"
}