Detail publikace

Modification of the CBCM Method

Originální název

Modification of the CBCM Method

Anglický název

Modification of the CBCM Method

Jazyk

en

Originální abstrakt

This paper deals with a modification of the CBCM method for floating nonlinear device characterization. Closed form analytical formulae for the estimation of CBCM errors due to parasitic charge injection are presented. A test chip implementing the method was designed and manufactured in the 0.35m CMOS process.

Anglický abstrakt

This paper deals with a modification of the CBCM method for floating nonlinear device characterization. Closed form analytical formulae for the estimation of CBCM errors due to parasitic charge injection are presented. A test chip implementing the method was designed and manufactured in the 0.35m CMOS process.

BibTex


@inproceedings{BUT23789,
  author="Zdeněk {Kolka} and Tomáš {Sutorý} and Viera {Biolková}",
  title="Modification of the CBCM Method",
  annote="This paper deals with a modification of the CBCM method for floating nonlinear device characterization. Closed form analytical formulae for the estimation of CBCM errors due to parasitic charge injection are presented. A test chip implementing the method was designed and manufactured in the 0.35m CMOS process.",
  address="World Scientific and Engineering Academy and Society",
  booktitle="Proceedings of the11th International Conference on CIRCUITS CSCC07",
  chapter="23789",
  institution="World Scientific and Engineering Academy and Society",
  year="2007",
  month="july",
  pages="88--91",
  publisher="World Scientific and Engineering Academy and Society",
  type="conference paper"
}