Detail publikace

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

KOTÁSEK, Z. STRNADEL, J.

Originální název

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

Anglický název

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

Jazyk

en

Originální abstrakt

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

Anglický abstrakt

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

Dokumenty

BibTex


@inproceedings{BUT22181,
  author="Zdeněk {Kotásek} and Josef {Strnadel}",
  title="SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System",
  annote="In the paper, upgraded version of our tool for learning and training of scan
design for testability technique principles and its consequences to parameters of
embedded system is presented. It is outlined how the tool can be utilized in
education process in order to ilustrate relation between design and diagnostic
parameters of embeded system.",
  address="IEEE Computer Society",
  booktitle="Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)",
  chapter="22181",
  institution="IEEE Computer Society",
  year="2006",
  month="march",
  pages="497--498",
  publisher="IEEE Computer Society",
  type="conference paper"
}