Detail publikace

Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Guen, E. Chapuis, PO. Klapetek, P. Puttock, R. Hay, B. Allard, A. Maxwell, T. Renahy, D. Valtr, M. Martinek, J. Gomes, S.

Originální název

Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

We first assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for the simultaneous identification of the local thermal conductivity and phase transition temperature of polymeric materials. In a second step, results of an interlaboratory comparison and an uncertainty analysis involving three laboratories applying the same protocol of phase transition temperature measurement allow evaluating the repeatability, the reproducibility and the reliability of the method.

Klíčová slova

Scanning Thermal Microscopy

Autoři

Guen, E.; Chapuis, PO.; Klapetek, P.; Puttock, R.; Hay, B.; Allard, A.; Maxwell, T.; Renahy, D.; Valtr, M.; Martinek, J.; Gomes, S.

Vydáno

26. 9. 2018

ISBN

978-1-5386-6759-0

Kniha

2018 24TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC)

Strany od

1

Strany do

6

Strany počet

6

BibTex

@inproceedings{BUT163752,
  author="Guen, E. and Chapuis, PO. and Klapetek, P. and Puttock, R. and Hay, B. and Allard, A. and Maxwell, T. and Renahy, D. and Valtr, M. and Martinek, J. and Gomes, S.",
  title="Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison",
  booktitle="2018 24TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC)",
  year="2018",
  pages="1--6",
  isbn="978-1-5386-6759-0"
}