Detail publikace

Comparison between noise characteristic of silicon solar cells and LBIC

Originální název

Comparison between noise characteristic of silicon solar cells and LBIC

Anglický název

Comparison between noise characteristic of silicon solar cells and LBIC

Jazyk

en

Originální abstrakt

The possibility of the use of noise measurements in analysis, diagnostic and prediction for reliability of elekctronic devices was studied by many researchers.

Anglický abstrakt

The possibility of the use of noise measurements in analysis, diagnostic and prediction for reliability of elekctronic devices was studied by many researchers.

BibTex


@inproceedings{BUT15587,
  author="Jiří {Vaněk} and Zdeněk {Chobola} and Jiří {Kazelle}",
  title="Comparison between noise characteristic of silicon solar cells and LBIC",
  annote="The possibility of the use of noise measurements in analysis, diagnostic and prediction for reliability of elekctronic devices was studied by many researchers.",
  address="CTU Prague",
  booktitle="Phasical and material engineereing 2005",
  chapter="15587",
  institution="CTU Prague",
  year="2005",
  month="september",
  pages="48",
  publisher="CTU Prague",
  type="conference paper"
}