Detail publikace

Behavior of CMOS Polymorphic Circuits in High Temperature Environment

RŮŽIČKA, R. ŠIMEK, V. SEKANINA, L.

Originální název

Behavior of CMOS Polymorphic Circuits in High Temperature Environment

Anglický název

Behavior of CMOS Polymorphic Circuits in High Temperature Environment

Jazyk

en

Originální abstrakt

The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.

Anglický abstrakt

The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 which is configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.

Dokumenty

BibTex


@inproceedings{BUT76318,
  author="Richard {Růžička} and Václav {Šimek} and Lukáš {Sekanina}",
  title="Behavior of CMOS Polymorphic Circuits in High Temperature Environment",
  annote="The paper describes a series of experiments performed with the aim to analyze the
fundamental impact of high temperatures on behavior of polymorphic digital
circuits. These experiments were conducted using a reconfigurable polymorphic
chip REPOMO32 which is configured (in addition to the configuration bit stream)
using the level of power supply voltage (Vdd). Experiments show that polymorphic
gates in the chip can be easily involved (in terms of functionality) not only by
Vdd, but also by temperature. Because experiments also prove that the physical
design of the REPOMO32 chip is robust enough to keep the functionality of all
circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide
range of operating temperature, the chip can also be used for future designs of
digital polymorphic circuits controlled by temperature.",
  address="IEEE Computer Society",
  booktitle="Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  chapter="76318",
  edition="NEUVEDEN",
  howpublished="print",
  institution="IEEE Computer Society",
  year="2011",
  month="april",
  pages="447--452",
  publisher="IEEE Computer Society",
  type="conference paper"
}