Detail publikace

Spectral measurements of semiconductor structures using optical near-field approach

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L.

Originální název

Spectral measurements of semiconductor structures using optical near-field approach

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The measurements of local photoluminescence, local photocurrent on GaAs/AlGaAs quantum wells under ambient temperature 300 K have been performed. The level of the locally induced signal in function excitation energy, probe-sample distance and sample position has been studied. The method is relevant to the study of the local defects, to evaluate the aging process of devices.

Klíčová slova

Semiconductor structures, quantum well, near-field, spectroscopy

Autoři

TOMÁNEK, P., BENEŠOVÁ, M., DOBIS, P., OTEVŘELOVÁ, D., GRMELA, L.

Rok RIV

2003

Vydáno

25. 4. 2002

Nakladatel

KU Leuven, COST 523

Místo

Leuven, Belgie

Strany od

P55

Strany počet

1