Detail publikace

Low Frequency Noise Measuring in Semiconductor Devices

Originální název

Low Frequency Noise Measuring in Semiconductor Devices

Anglický název

Low Frequency Noise Measuring in Semiconductor Devices

Jazyk

en

Originální abstrakt

The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.

Anglický abstrakt

The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.

BibTex


@inproceedings{BUT28507,
  author="Alexey {Andreev} and Jiří {Zajaček} and Lubomír {Grmela} and Vladimír {Holcman}",
  title="Low Frequency Noise Measuring in Semiconductor Devices",
  annote="The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.",
  address="Dr. Laszlo Lehoczky",
  booktitle="6th International Conference of PhD Students",
  chapter="28507",
  edition="Dr. Laszlo Lehoczky",
  institution="Dr. Laszlo Lehoczky",
  year="2007",
  month="august",
  pages="179--184",
  publisher="Dr. Laszlo Lehoczky",
  type="conference paper"
}