Detail publikace

Nonlinear On-chip Capacitor Characterization

Originální název

Nonlinear On-chip Capacitor Characterization

Anglický název

Nonlinear On-chip Capacitor Characterization

Jazyk

en

Originální abstrakt

The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35um CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was used for MOSCAPs characterization in full operating voltage range.

Anglický abstrakt

The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35um CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was used for MOSCAPs characterization in full operating voltage range.

BibTex


@inproceedings{BUT23792,
  author="Tomáš {Sutorý} and Zdeněk {Kolka} and Dalibor {Biolek} and Viera {Biolková}",
  title="Nonlinear On-chip Capacitor Characterization",
  annote="The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35um CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was used for MOSCAPs characterization in full operating voltage range.",
  address="IEEE",
  booktitle="Proceedings of the 18th European Conference on Circuit Theory and Design ECCTD'07",
  chapter="23792",
  institution="IEEE",
  year="2007",
  month="september",
  pages="220--223",
  publisher="IEEE",
  type="conference paper"
}