Detail publikace

Metal-Semiconductor Contact Modeling and Transport Characteristics Detectors of Radiation Based on the CdTe

Alexey Andreev, Jiri zajacek

Originální název

Metal-Semiconductor Contact Modeling and Transport Characteristics Detectors of Radiation Based on the CdTe

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Series VA characteristic measurements in the dark were carried out at de-pendence on temperature and we have found cur-rent’s function depending from temperature. We have found differences in transport characteristics after temperature degradation process.

Klíčová slova

CdTe sensor, 1/f noise,Schottky barrier

Autoři

Alexey Andreev, Jiri zajacek

Rok RIV

2006

Vydáno

1. 1. 2006

Nakladatel

TU Vienna

Místo

Vienna, Austria

ISBN

3-902463-05-8

Kniha

Proceedings of the Junior Scientist Conference 2006

Strany od

191

Strany do

192

Strany počet

2

BibTex

@inproceedings{BUT18506,
  author="Alexey {Andreev} and Jiří {Zajaček}",
  title="Metal-Semiconductor Contact Modeling and Transport Characteristics Detectors of Radiation Based on the CdTe",
  booktitle="Proceedings of the Junior Scientist Conference 2006",
  year="2006",
  pages="2",
  publisher="TU Vienna",
  address="Vienna, Austria",
  isbn="3-902463-05-8"
}