Detail publikace

Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond

ŠTUBIAN, M. BOBEK, J. SETVÍN, M. DIEBOLD, U. SCHMID, M.

Originální název

Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

A transimpedance amplifier has been designed for scanning tunneling microscopy (STM). The amplifier features low noise (limited by the Johnson noise of the 1 G Omega feedback resistor at low input current and low frequencies), sufficient bandwidth for most STM applications (50 kHz at 35 pF input capacitance), a large dynamic range (0.1 pA-50 nA without range switching), and a low input voltage offset. The amplifier is also suited for placing its first stage into the cryostat of a low-temperature STM, minimizing the input capacitance and reducing the Johnson noise of the feedback resistor. The amplifier may also find applications for specimen current imaging and electron-beam-induced current measurements in scanning electron microscopy and as a photodiode amplifier with a large dynamic range. This paper also discusses the sources of noise including the often neglected effect of non-balanced input impedance of operational amplifiers and describes how to accurately measure and adjust the frequency response of low-current transimpedance amplifiers.

Klíčová slova

THERMAL NOISE; SINGLE ATOMS; GATE NOISE; BANDWIDTH; PREAMPLIFIER; SURFACE

Autoři

ŠTUBIAN, M.; BOBEK, J.; SETVÍN, M.; DIEBOLD, U.; SCHMID, M.

Vydáno

1. 7. 2020

Nakladatel

AMER INST PHYSICS

Místo

MELVILLE

ISSN

0034-6748

Periodikum

Review of Scientific Instruments

Ročník

91

Číslo

7

Stát

Spojené státy americké

Strany od

1

Strany do

11

Strany počet

11

URL

https://aip.scitation.org/doi/10.1063/5.0011097

BibTex

@article{BUT177312,
  author="Martin {Štubian} and Juraj {Bobek} and Martin {Setvín} and Ulrike {Diebold} and Michael {Schmid}",
  title="Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond",
  journal="Review of Scientific Instruments",
  year="2020",
  volume="91",
  number="7",
  pages="1--11",
  doi="10.1063/5.0011097",
  issn="0034-6748",
  url="https://aip.scitation.org/doi/10.1063/5.0011097"
}