Detail publikace

BUT- PT System Description for NIST LRE 2017

MATĚJKA, P. PLCHOT, O. NOVOTNÝ, O. CUMANI, S. LOZANO DÍEZ, A. SLAVÍČEK, J. DIEZ SÁNCHEZ, M. GRÉZL, F. GLEMBEK, O. KAMSALI VEERA, M. SILNOVA, A. BURGET, L. ONDEL YANG, L. KESIRAJU, S. ROHDIN, J.

Originální název

BUT- PT System Description for NIST LRE 2017

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

This article is about the BUT - PT System Description for the NIST LRE 2017 evaluation. We have built over 30 systems for this evaluation with the main focus to build a  single best system. We experimented with denoising NN, automatic discovery units, different flavors of phonotactic systems, different backends, different sizes of i-vector systems, different BN features, NN embeddings and frame level language classifiers. The evaluation plan stated "Teams are encouraged to report whether and how having access to the development set helped improve the performance". The development data helped mainly in the final classifier and also helped in the decision process which techniques to use and which to fuse because our test set consisted of this data.

Klíčová slova

speech recognition, language recognition

Autoři

MATĚJKA, P.; PLCHOT, O.; NOVOTNÝ, O.; CUMANI, S.; LOZANO DÍEZ, A.; SLAVÍČEK, J.; DIEZ SÁNCHEZ, M.; GRÉZL, F.; GLEMBEK, O.; KAMSALI VEERA, M.; SILNOVA, A.; BURGET, L.; ONDEL YANG, L.; KESIRAJU, S.; ROHDIN, J.

Vydáno

12. 12. 2017

Nakladatel

National Institute of Standards and Technology

Místo

Orlando, Florida

Strany od

1

Strany do

6

Strany počet

6

URL

https://www.fit.vut.cz/research/publication/11655/

BibTex

@inproceedings{BUT168463,
  author="MATĚJKA, P. and PLCHOT, O. and NOVOTNÝ, O. and CUMANI, S. and LOZANO DÍEZ, A. and SLAVÍČEK, J. and DIEZ SÁNCHEZ, M. and GRÉZL, F. and GLEMBEK, O. and KAMSALI VEERA, M. and SILNOVA, A. and BURGET, L. and ONDEL YANG, L. and KESIRAJU, S. and ROHDIN, J.",
  title="BUT- PT System Description for NIST LRE 2017",
  booktitle="Proceedings of NIST Language Recognition Workshop 2017",
  year="2017",
  pages="1--6",
  publisher="National Institute of Standards and Technology",
  address="Orlando, Florida",
  url="https://www.fit.vut.cz/research/publication/11655/"
}