Detail publikace

Noise in Passive Components - Resistors and Capacitors

PAVELKA, J., ŠIKULA, J., TACANO, M.

Originální název

Noise in Passive Components - Resistors and Capacitors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and current noise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between leakage current and noise based quality indicators and optimize aging procedure

Klíčová slova v angličtině

low-frequency noise, thick film resistors, tantalum capacitors, reliability

Autoři

PAVELKA, J., ŠIKULA, J., TACANO, M.

Vydáno

1. 1. 2002

Nakladatel

Meisei University

Místo

Tokio

Strany od

110

Strany do

115

Strany počet

6

BibTex

@inproceedings{BUT16521,
  author="Jan {Pavelka} and Josef {Šikula} and Munecazu {Tacano}",
  title="Noise in Passive Components - Resistors and Capacitors",
  booktitle="Proceedings of the 13th Symposium on Advanced Materials",
  year="2002",
  pages="6",
  publisher="Meisei University",
  address="Tokio"
}