Detail publikace

Electroelastic Field of a Sphere Located in the Vicinity of a Plane Piezoelectric Surface

STARKOV, A. STARKOV, I.

Originální název

Electroelastic Field of a Sphere Located in the Vicinity of a Plane Piezoelectric Surface

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The electric field generated by a scanning probe microscope is determined. Analytical expressions for the electroelastic field in a piezoelectric sample and the external electric field are derived for a spherical probe. It is demonstrated that the coupling of elastic and electrostatic fields in the piezoelectric material leads to energy redistribution between such fields. This circumstance causes variations in the normal component of the electric field strength at the interface and the capacitance of a probe.

Klíčová slova

Scanning probe microscope, electroelastic field, pietoelectric material

Autoři

STARKOV, A.; STARKOV, I.

Vydáno

15. 1. 2016

Nakladatel

PLEIADES PUBLISHING INC

Místo

MOSCOW

ISSN

1063-7842

Periodikum

TECHNICAL PHYSICS

Ročník

61

Číslo

1

Stát

Ruská federace

Strany od

23

Strany do

27

Strany počet

5

URL

BibTex

@article{BUT163514,
  author="Alexander {Starkov} and Ivan {Starkov}",
  title="Electroelastic Field of a Sphere Located in the Vicinity of a Plane Piezoelectric Surface",
  journal="TECHNICAL PHYSICS",
  year="2016",
  volume="61",
  number="1",
  pages="23--27",
  doi="10.1134/S1063784216010217",
  issn="1063-7842",
  url="https://link.springer.com/article/10.1134/S1063784216010217"
}