Detail publikace

Application of new measurement method to integrated capacitor characterization

Originální název

Application of new measurement method to integrated capacitor characterization

Anglický název

Application of new measurement method to integrated capacitor characterization

Jazyk

en

Originální abstrakt

A new measurement method has been developed for non-linear integrated capacitor characterization. The paper deals with its application on a test-chip with some test structures of capacitors. The test chip serves for research into methods of nonlinear gate capacitance compensation.

Anglický abstrakt

A new measurement method has been developed for non-linear integrated capacitor characterization. The paper deals with its application on a test-chip with some test structures of capacitors. The test chip serves for research into methods of nonlinear gate capacitance compensation.

BibTex


@inproceedings{BUT16029,
  author="Tomáš {Sutorý}",
  title="Application of new measurement method to integrated capacitor characterization",
  annote="A new measurement method has been developed for non-linear integrated capacitor characterization. The paper deals with its application on a test-chip with some test structures of capacitors. The test chip serves for research into methods of nonlinear gate capacitance compensation.",
  address="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  booktitle="Moderní metody řešení, návrhu a aplikace elektronických obvodů",
  chapter="16029",
  institution="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  year="2005",
  month="january",
  pages="65",
  publisher="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  type="conference paper"
}