Detail publikace

Test-chip for non-linear capacitors characterization

Originální název

Test-chip for non-linear capacitors characterization

Anglický název

Test-chip for non-linear capacitors characterization

Jazyk

en

Originální abstrakt

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

Anglický abstrakt

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

BibTex


@inproceedings{BUT15128,
  author="Tomáš {Sutorý} and Zdeněk {Kolka}",
  title="Test-chip for non-linear capacitors characterization",
  annote="The paper deals with characterization and linearization of non-linear capacitors of MOS
transistors. Basic principles of compensation are presented. A test chip for nonlinear
capacitance characterization implementing a new measurement method has been developed.",
  address="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  booktitle="EDS '05 IMAPS CS International Conference Proceedings",
  chapter="15128",
  institution="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  year="2005",
  month="january",
  pages="396",
  publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  type="conference paper"
}