Detail publikace

Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Veronika Novotná

Originální název

Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper deals with usage of a low voltage STEM for biological purposes. The investigation of electron beam induced mass loss of ultrathin sections of three embedding media is presented. The mass loss of the sample caused by the electron bombardment is not examined in detail in the literature but it seems to be an important fact in investigation of biological samples by low voltage STEM. The samples of different thickness were investigated using different microscope settings (acceleration voltage, total dose, probe current, cleaning of the sample surface) and STEM imaging modes (bright-field, dark-field).

Klíčová slova

STEM, Mass loss, Embedding media, Total irradiated dose

Autoři

Veronika Novotná

Rok RIV

2014

Vydáno

5. 5. 2014

Nakladatel

LITERA

Místo

Brno

ISBN

978-80-214-4923-7

Kniha

Student EEICT - Proceedings of the 20th conference

Číslo edice

1

Strany od

139

Strany do

141

Strany počet

288

BibTex

@inproceedings{BUT121043,
  author="Veronika {Novotná}",
  title="Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM",
  booktitle="Student EEICT - Proceedings of the 20th conference",
  year="2014",
  number="1",
  pages="139--141",
  publisher="LITERA",
  address="Brno",
  isbn="978-80-214-4923-7"
}