Detail publikace

Current Fluctuations of Reverse-Biased Solar Cells

ŠKVARENINA, Ľ.

Originální název

Current Fluctuations of Reverse-Biased Solar Cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper presents mainly noise diagnostics of pn junctions local defects in a single-crystalline silicon solar cells structure. Research consists of a non-destructive measurement methodology of reverse-biased junction in solar cells. Diagnostics of defect areas in this documents are based especially on measurement of noise power spectral density, measurement of the radiation emitted from defects in visible range and I-V characteristic measurement.

Klíčová slova

Solar Cells; Silicon; Noise Spectroscopy; Diagnostics; Defects; Flicker Noise

Autoři

ŠKVARENINA, Ľ.

Rok RIV

2015

Vydáno

23. 4. 2015

Nakladatel

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií

Místo

Brno

ISBN

978-80-214-5148-3

Kniha

Proceedings of the 21st Conference STUDENT EEICT 201

Číslo edice

1.

Strany od

546

Strany do

550

Strany počet

5

URL

http://www.feec.vutbr.cz/EEICT/2015/sbornik/EEICT-2015-sbornik-komplet_v2.pdf

BibTex

@inproceedings{BUT115271,
  author="Ľubomír {Škvarenina}",
  title="Current Fluctuations of Reverse-Biased Solar Cells",
  booktitle="Proceedings of the 21st Conference STUDENT EEICT 201",
  year="2015",
  number="1.",
  pages="546--550",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií",
  address="Brno",
  isbn="978-80-214-5148-3",
  url="http://www.feec.vutbr.cz/EEICT/2015/sbornik/EEICT-2015-sbornik-komplet_v2.pdf"
}