Detail publikace

Scanning Probe Microscopy in Technology of Solar Cells Production

MOJROVÁ, B. BAŘINKOVÁ, P. BOUŠEK, J. HÉGR, O. BAŘINKA, R. HOFMAN, J.

Originální název

Scanning Probe Microscopy in Technology of Solar Cells Production

Anglický název

Scanning Probe Microscopy in Technology of Solar Cells Production

Jazyk

en

Originální abstrakt

This article deals with implementation of SPM techniques (AFM and KPFM) to the characterization of crystalline silicon solar cells.

Anglický abstrakt

This article deals with implementation of SPM techniques (AFM and KPFM) to the characterization of crystalline silicon solar cells.

Dokumenty

BibTex


@article{BUT111341,
  author="Barbora {Mojrová} and Pavlína {Bařinková} and Jaroslav {Boušek} and Ondřej {Hégr} and Radim {Bařinka} and Jiří {Hofman}",
  title="Scanning Probe Microscopy in Technology of Solar Cells Production",
  annote="This article deals with implementation of SPM techniques (AFM and KPFM) to the characterization of crystalline silicon solar cells.",
  address="ElectroScope",
  chapter="111341",
  howpublished="online",
  institution="ElectroScope",
  number="3",
  volume="2014",
  year="2014",
  month="december",
  pages="1--6",
  publisher="ElectroScope",
  type="journal article - other"
}