Detail publikace

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Originální název

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Anglický název

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

čeština

Originální abstrakt

Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools

Klíčová slova v angličtině

Silar Cell

Autoři

VANĚK, J., CHOBOLA, Z., BAŘINKA, R.

Rok RIV

2002

Vydáno

1. 1. 2002

Nakladatel

Czech Technical University in Praque

Místo

Herbertov

ISBN

80-01-02579-9

Kniha

Proceedings of International Workshop Physical and Maaterial Engineering 2002

Strany od

121

Strany do

122

Strany počet

2

BibTex

@inproceedings{BUT10405,
  author="Jiří {Vaněk} and Zdeněk {Chobola} and Radim {Bařinka}",
  title="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools",
  booktitle="Proceedings of International Workshop Physical and Maaterial Engineering 2002",
  year="2002",
  pages="2",
  publisher="Czech Technical University in Praque",
  address="Herbertov",
  isbn="80-01-02579-9"
}