Detail publikace

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Originální název

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Anglický název

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Jazyk

en

Originální abstrakt

As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches devoted to verification of hardened systems, with respect to the test set generation: the first one is based on classical Automatic Test Pattern Generation, the second one on Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced few ideas about their combination in order to create a new promising approach for verification of reliable systems.

Anglický abstrakt

As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches devoted to verification of hardened systems, with respect to the test set generation: the first one is based on classical Automatic Test Pattern Generation, the second one on Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced few ideas about their combination in order to create a new promising approach for verification of reliable systems.

BibTex


@inproceedings{BUT103467,
  author="Marcela {Zachariášová} and Cristiana {Bolchini} and Zdeněk {Kotásek}",
  title="Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability",
  annote="As the complexity of current hardware systems rises rapidly, it is a challenging
task to harden these systems against faults and to complete their verification
and manufacturing test. Not only that verification and testing take
a considerable amount of time but the number of design errors, faults,
manufacturing defects and crosstalks increases with the rising complexity as
well. Furthermore, when a system is designed to be reliable new issues come into
play making the picture even more complex. In this paper we performed a detailed
analysis of two approaches
devoted to verification of hardened systems, with respect to the
test set generation: the first one is based on classical Automatic
Test Pattern Generation, the second one on Constrained-random
Stimulus Generation. We evaluated their qualities as well as their
drawbacks and introduced few ideas about their combination
in order to create a new promising approach for verification of
reliable systems.",
  address="IEEE Computer Society",
  booktitle="IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  chapter="103467",
  edition="NEUVEDEN",
  howpublished="print",
  institution="IEEE Computer Society",
  year="2013",
  month="april",
  pages="275--278",
  publisher="IEEE Computer Society",
  type="conference paper"
}