This course aims to provide advanced knowledge on experimental methods employed in surface science experiments.  The focus is laid on deep understanding of the ultrahigh vacuum technology (UHV, 1 lecture), scanning probe methods under UHV conditions (STM, nc-AFM, STS, 2 lectures), electron spectroscopies (XPS, UPS, ARPES, 4 lectures), low-energy electron microscopy and diffraction (LEEM, LEED, 2 lectures), low energy ion scattering (LEIS, 1 lecture), and vibrational spectroscopies (FTIR, HREELS, 1 lecture). This will be complemented by an overview of other methods (2 lectures), e.g., those using synchrotron radiation.