Detail publikace

MATCHING IN MILLER OTA: CASE STUDY

HÁZE, J. LAŽA, M. BOHRN, M.

Originální název

MATCHING IN MILLER OTA: CASE STUDY

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The downscaling of device as transistors causes the unpredictability of analog circuit yield. Transistor mismatch is one of the obstacles to achieve high yield. Analog circuit designers usually run simulation to predict the functionality of their circuits. Monte Carlo simulation is often used. If you have offset as crucial parameter than you need to calculate proper sizes of all transistors in blocks, which have influence to offset.

Klíčová slova

Miller OTA

Autoři

HÁZE, J.; LAŽA, M.; BOHRN, M.

Vydáno

9. 9. 2009

Nakladatel

IMAPS CZ/SK

Místo

Brno

ISBN

978-80-214-3717-3

Kniha

Proceedings on 15th International EDS Conference 2008

Strany od

341

Strany do

346

Strany počet

5

BibTex

@inproceedings{BUT32417,
  author="Jiří {Háze} and Martin {Laža} and Marek {Bohrn}",
  title="MATCHING IN MILLER OTA: CASE STUDY",
  booktitle="Proceedings on 15th International EDS Conference 2008",
  year="2009",
  pages="341--346",
  publisher="IMAPS CZ/SK",
  address="Brno",
  isbn="978-80-214-3717-3"
}