Detail publikace

Optical methods for extreme level measurement

DREXLER, P. JIRKŮ, T. STEINBAUER, M. FIALA, P.

Originální název

Optical methods for extreme level measurement

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

There are certain optical methods for the measurement of ultra-short solitary electromagnetic pulses or low-level measurement. The measurement methods properties have to correspond to the fact of whether we want to measure pulses of voltage, current or a free-space electromagnetic wave. The need for specific measurement methods occurred owing to the development of high power microwave pulse generator. Certain applicable methods are presented in this paper. For the same purpose, the magneto-optic method can be utilized with respect to its advantages. For the measurement of the output microwave pulse of the generator, the optical method was designed and realized. Low-level optical measurement methods were used for nano-layers measurement and experimentally verified with regard to air ion concentration test.

Klíčová slova

optical methods, extreme level measurement, magnetooptic effect, electrooptic effect, ion measurement

Autoři

DREXLER, P.; JIRKŮ, T.; STEINBAUER, M.; FIALA, P.

Rok RIV

2007

Vydáno

8. 6. 2007

Nakladatel

IEEE

Místo

Pisa, Italy

ISBN

1-4244-1276-5

Kniha

2007 International Waveform Diversity and Design Conference

Strany od

131

Strany do

135

Strany počet

5

BibTex

@inproceedings{BUT25606,
  author="Petr {Drexler} and Tomáš {Jirků} and Miloslav {Steinbauer} and Pavel {Fiala}",
  title="Optical methods for extreme level measurement",
  booktitle="2007 International Waveform Diversity and Design Conference",
  year="2007",
  pages="131--135",
  publisher="IEEE",
  address="Pisa, Italy",
  isbn="1-4244-1276-5"
}