Detail publikace

Reliability and Safety Issues of FPGA Based Designs

KVÁŠ, M. VALACH, S. FIEDLER, P.

Originální název

Reliability and Safety Issues of FPGA Based Designs

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

With decreasing price and growing computational power FPGAs become interesting solution for growing set of embedded applications. It is often considered competitor for MCU or ASIC based solutions, mainly for their good ratio of computational capacity to price and its flexibility. Unfortunately the FPGA technology has some specifics that complicate their deployment in systems with requirements on high reliability and safety integrity. The most severe reliability issue is susceptibility to radiation induced errors. This paper introduces to this problem, techniques that are used to cope with it and gives comparison to MCU based solution.

Klíčová slova

FPGA, SEU, reliability, safety, radiation effects.

Autoři

KVÁŠ, M.; VALACH, S.; FIEDLER, P.

Rok RIV

2012

Vydáno

23. 5. 2012

Nakladatel

VUT Brno

Místo

Brno

ISBN

978-3-902823-21-2

Kniha

Proceedings of 11th IFAC/IEEE International Conference on Programmable Devices and Embedded Systems PDeS2012

Strany od

176

Strany do

181

Strany počet

6

BibTex

@inproceedings{BUT96421,
  author="Marek {Kváš} and Soběslav {Valach} and Petr {Fiedler}",
  title="Reliability and Safety Issues of FPGA Based Designs",
  booktitle="Proceedings of 11th IFAC/IEEE International Conference on Programmable Devices and Embedded Systems PDeS2012",
  year="2012",
  pages="176--181",
  publisher="VUT Brno",
  address="Brno",
  isbn="978-3-902823-21-2"
}