Detail publikace

Low-frequency noise and microplasma measurements as a faster tool to investigate the quality of monocrystalline-silicon solar cells

CHOBOLA, Z. LUŇÁK, M. VANĚK, J. JURÁNKOVÁ, V. BAŘINKA, R.

Originální název

Low-frequency noise and microplasma measurements as a faster tool to investigate the quality of monocrystalline-silicon solar cells

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

Two sets of c-Si solar cells varying in front side phosphorus doped emitters were produced by standard screen printing technique. The first group of samples 3121 was prepared by combination of standard washing and bath with and highly dilute HF before diffusion of n+-emitter. The second group of samples 3122 was treated only with standard washing. This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence. As it was already shown in previous publications [1-3] noise spectral density reflects the quality of solar cells and thus it represents an alternative advanced cell diagnostic tool. Our results confirm this relationship and moreover bring the clear evidence for the maximum spectral noise voltage density being related with the emitter structure. The best results were reached for a group of solar cell with of samples 3122 was treated only with standard washing.

Klíčová slova

low noise, solar cells

Autoři

CHOBOLA, Z.; LUŇÁK, M.; VANĚK, J.; JURÁNKOVÁ, V.; BAŘINKA, R.

Rok RIV

2012

Vydáno

17. 4. 2012

Nakladatel

SPIE

Místo

Brusel

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

2012

Číslo

8431

Stát

Spojené státy americké

Strany od

843129-1

Strany do

843129-6

Strany počet

6