Detail publikace

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T.

Originální název

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.

Klíčová slova v angličtině

Niobium oxide, Capacitors, Passive components, Breakdown

Autoři

ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T.

Rok RIV

2003

Vydáno

1. 1. 2003

Nakladatel

Electronic Components Institute Internationale Ltd.

Místo

United Kingdom

ISBN

0887-7491

Kniha

CARTS - EUROPE 2003 Proceedings

Strany od

281

Strany do

285

Strany počet

5

BibTex

@inproceedings{BUT9080,
  author="Josef {Šikula} and Jan {Hlávka} and Vlasta {Sedláková} and Lubomír {Grmela} and Pavel {Höschel} and Tomáš {Zedníček}",
  title="Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors",
  booktitle="CARTS - EUROPE 2003 Proceedings",
  year="2003",
  pages="5",
  publisher="Electronic Components Institute Internationale Ltd.",
  address="United Kingdom",
  isbn="0887-7491"
}