Detail publikace

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

Originální název

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

Anglický název

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

Jazyk

en

Originální abstrakt

Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.

Anglický abstrakt

Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.

BibTex


@inproceedings{BUT9080,
  author="Josef {Šikula} and Jan {Hlávka} and Vlasta {Sedláková} and Lubomír {Grmela} and Pavel {Höschel} and Tomáš {Zedníček}",
  title="Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors",
  annote="Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.",
  address="Electronic Components Institute Internationale Ltd.",
  booktitle="CARTS - EUROPE 2003 Proceedings",
  chapter="9080",
  institution="Electronic Components Institute Internationale Ltd.",
  year="2003",
  month="january",
  pages="281",
  publisher="Electronic Components Institute Internationale Ltd.",
  type="conference paper"
}