Detail publikace

The effect of silver diffusion from contact electrode into thick film resistors

Originální název

The effect of silver diffusion from contact electrode into thick film resistors

Anglický název

The effect of silver diffusion from contact electrode into thick film resistors

Jazyk

en

Originální abstrakt

We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.

Anglický abstrakt

We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.

BibTex


@inproceedings{BUT9064,
  author="Vlasta {Sedláková} and František {Melkes} and Lubomír {Grmela} and Pavel {Dobis} and Josef {Šikula} and Munecazu {Tacano} and Dubravka {Ročak} and Darko {Belavič}",
  title="The effect of silver diffusion from contact electrode into thick film resistors",
  annote="We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.",
  address="Electronic Components Institute Internationale Ltd.",
  booktitle="CARTS - EUROPE 2003 Proceedings",
  chapter="9064",
  institution="Electronic Components Institute Internationale Ltd.",
  year="2003",
  month="january",
  pages="201",
  publisher="Electronic Components Institute Internationale Ltd.",
  type="conference paper"
}